I'm having trouble with a hard drive that is (supposed to be) a part of a RAID5. Here's is the smart log:
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-107-generic] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: HUH721212ALE601 Serial Number: 8DHHX2AH LU WWN Device Id: 5 000cca 253d55276 Firmware Version: LEGL0002 User Capacity: 12,000,138,625,024 bytes [12.0 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 7200 rpm Form Factor: 3.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Jun 2 09:58:42 2024 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 87) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 1) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0 2 Throughput_Performance 0x0005 132 132 054 Pre-fail Offline - 96 3 Spin_Up_Time 0x0007 253 253 024 Pre-fail Always - 78 (Average 35) 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 92 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 140 140 020 Pre-fail Offline - 15 9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 13784 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 18 22 Unknown_Attribute 0x0023 100 100 025 Pre-fail Always - 100 45 Unknown_Attribute 0x0023 100 100 001 Pre-fail Always - 1095233372415 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 277 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 277 194 Temperature_Celsius 0x0002 162 162 000 Old_age Always - 37 (Min/Max 15/57) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 177 177 000 Old_age Always - 35 231 Temperature_Celsius 0x0032 100 100 000 Old_age Always - 0 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 1249778606260 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 1530512354490 SMART Error Log Version: 1 ATA Error Count: 35 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 35 occurred at disk power-on lifetime: 13784 hours (574 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 43 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 61 01 68 08 00 00 40 08 00:16:02.030 WRITE FPDMA QUEUED 2f 00 01 30 06 00 a0 08 00:16:02.028 READ LOG EXT 2f 00 01 30 00 00 a0 08 00:16:02.027 READ LOG EXT 2f 00 01 00 00 00 a0 08 00:16:02.027 READ LOG EXT 2f 00 01 30 08 00 a0 08 00:16:02.026 READ LOG EXT Error 34 occurred at disk power-on lifetime: 13784 hours (574 days + 8 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 43 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 61 01 20 08 00 00 40 08 00:16:01.440 WRITE FPDMA QUEUED ea 00 00 00 00 00 a0 08 00:16:01.440 FLUSH CACHE EXT 60 08 00 08 00 00 40 08 00:16:01.427 READ FPDMA QUEUED 60 01 f8 10 00 00 40 08 00:16:01.427 READ FPDMA QUEUED 60 08 b8 08 00 00 40 08 00:16:01.427 READ FPDMA QUEUED [...] SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 13784 - # 2 Short offline Completed without error 00% 13386 - # 3 Vendor (0x70) Completed without error 00% 13326 - # 4 Vendor (0x71) Completed without error 00% 13325 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. As you can see several smart tests run througgh fine. However when i try to re-add the drive to my array, the drive keeps changing to a different device letter.
From the dmesg output, it looks like there is a communication issue as it seems to dial down the interfact speed (dmesg output below).
Is this a cable issue, is the controller at fault, or is really the drive defective? I have four of the drives in place, and this is the only one to cause issues - but I don't have a spare SATA port to test the drive at another port.
The fill dmesg is available here
